Document Type

Article

Publication Date

1-30-2024

Abstract

We report on magnetron deposition of thin superconducting rhenium films on sapphire substrates. During the deposition, substrates were held at ambient temperature. Critical temperature of the films is Tc ~ 3.6 K. Films have polycrystalline structure, and grazing incidence X-ray diffractometry indicates that crystalline lattice parameters are somewhat larger compared to the bulk ones. Magnetoresistive and AC/DC susceptibilities allowed us to determine Hc1 and Hc2 of these films, as well as estimate coherence length ξ(0) and magnetic penetration depth λL(0). We also provide information on surface morphology of these films.

Comments

This is a pre-copy-editing, author-produced PDF of an article accepted for publication in Optical Memory and Neural Networks, volume 32, in 2024 following peer review. The final publication may differ and is available at Springer via https://doi.org/10.3103/S1060992X23070184.

A free-to-read copy of the final published article is available here.

Peer Reviewed

1

Copyright

Springer

Available for download on Thursday, January 30, 2025

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